求3篇IEEE论文: Pure-mode network analyzer for on-wafer measurements of mixed-mode S-parameters .pdf

1. David E. Bockelman and William R. Eisenstadt, “Combined Differential and Common-
Mode Scattering Parameters: Theory and Simulation,” IEEE Transactions on Microwave
Theory and Techniques, Vol. 43, No. 7, July 1995.

2. David E. Bockelman and William R. Eisenstadt, “Pure- Mode Network Analyzer for
On-Wafer Measurements of Mixed-Mode S-Parameters of Differential Circuits,” IEEE

3. A.G. Chiariello, A. Maffucci, G. Miano, F. Villone, and W. Zamboni, “A Transmission-
Line Model for Full-Wave Analysis of Mixed-Mode Propagation,” IEEE Transactions on
Advanced Packaging, Vol. 31, No. 2, May 2008

传上来了

多谢了，{:soso_e100:}

2楼是雷锋，很好很专业