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采用经验方法由近场区测量预测高速电路板的远场辐射: Near-Field to Far-Field Prediction for High-Speed Board.pdf

 

采用经验方法由近场区测量预测高速电路板的远场辐射:
Abstract— This paper describes a methodology to predict farfield (FF) emissions from a high-speed board based on the fields
measured in the near-field (NF) region. The NF to FF transformation is based upon an empirical relationship between
the measured fields in both the NF and FF regions. Initial results show that the predicted FF emissions from a high-speed board
provide the designer a good confidence on the compliance of regulatory emission limits.
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