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>Taber,R.C.,"A parallel plate resonator technique for microwave loss measurements on superconductors," Rev.Sci.Instrumen., Vol 61,1990,pp.2200-2206
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>Taber,R.C.,etc."A method for the accurate measurement of the complex conductivity of high-Tc superconductive thine films," J.Supercnd., Vol.5,1992,pp.371-378.

A parallel plate resonator technique for microwave loss measurements on superconductors
Rev. Sci. Instrum. 61, 2200 (1990); DOI:10.1063/1.1141389
Issue Date: August 1990

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ABSTRACT
REFERENCES (22)
CITING ARTICLES (73)
R. C. Taber
Hewlett-Packard Labs, 3500 Deer Creek Rd., P. O. Box 10350, Palo Alto, California 94303-0867
A simple method for the evaluation of microwave surface loss of superconductive samples is discussed. The method allows the evaluation of small (~1 cm×~1 cm), flat samples over a broad range of temperatures. It can accurately characterize samples with surface resistances as low as 5 µOmega or as high as 1 mOmega at 10 GHz. In addition to high resolution, it has several advantages: sample preparation requirements are minimal; the current distribution within the sample under test is relatively uniform and can be accurately calculated; no other superconducting or normal conducting material is required for the resonator, so no additional corrections for such materials are needed; and the procedure is comparatively rapid and can be performed in the necktube of a liquid-helium storage Dewar. Review of Scientific Instruments is copyrighted by The American Institute of Physics.
History: Received 20 February 1990; accepted 10 April 1990
Permalink: http://link.aip.org/link/?RSINAK/61/2200/1
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Taber,R.C.,etc."A method for the accurate measurement of the complex conductivity of high-Tc superconductive thin films," J.Supercnd., Vol.5,1992,pp.371-378.

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